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Defectometer M 1.837
NDT-INSTRUMENTS         
   
Defectometer M 1.837
Contact

NDT Instruments Indonesia
Jl. Sirsak / Casamora BB-1, Jagakarsa
Jakarta Selatan 12630
Jakarta Raya-Indonesia

t (62) 21 2943 0001 (Hunting)
f (62) 21 2943 0006
sales_ID@ndt-instruments.com

Compact mobile crack test instrument

The DEFECTOMETER M 1.837 is ideally suited for all situation requiring mobile crack testing. The unit has a defect resolution starting from just 20 µm and numerous automatic functions. The LED scale reading and LCD display ensure good legibility even in broad daylight or complete darkness. The long operating life of 35 h and USB port make it a perfect companion for manual crack and hardness testing and the separation of materials.

Your advantages at a glance

  • High sensitivity with a defect resolution from 20 µm
  • Simple operation
  • Automatic lift-off, zero, and tilt compensation
  • Warning for lifted off probe
  • Very good legibility of the LED scale display and the LCD display
  • 35-hour operation with activated backlighting
  • USB port for the visualization and documentation of the measurement results
  • Probes from earlier DEFECTOMETERs can be used

Technical Data

Sensitivity range : 0 – 20 dB in increments of 0.5 dB
Defect indication : Red LED display and acoustic warning signal via speaker or headphonesT
est speed : 0 – 0.15 m/s

Product Picture

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